Nano Letters Paper on Solution-Processed Silicon Carbide Electronics Published

Our lab has recently published a paper in the journal Nano Letters that presents diodes fabricated using Silicon Carbide nanowire inks. Specifically, we focus on the resilience of various device parameters in harsh environments. There is a general opinion that printed electronics cannot be compatible with either high-temperature or high-radiation applications. While this is true for more traditional inks, we prove that we can harness the resilience of bulk inorganic semiconductors within nanomaterial-laden inks. This work motivates the continued research into inks from inorganic nanomaterials to enable the infiltration of printed electronics into harsh environments. Please see the full paper here. Congrats on the wonderful publication, Kuan-Yu Chen!